By Joe Kelly
That includes valuable enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its variety source bargains skilled engineers a finished realizing of the complex issues in RF, SiP (system-in-package), and SoC (system-on-a-chip) construction checking out which are severe to their paintings concerning semiconductor units. The booklet covers key dimension recommendations for semiconductor equipment trying out and assists engineers in explaining those thoughts to administration to assist cut back venture price, time, and assets. in line with real-world event and choked with time-saving equations, this in-depth quantity bargains execs functional info on crucial issues that experience by no means been offered in one reference earlier than.
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Additional resources for Advanced Production Testing of RF, SoC, and SiP Devices
Signals that are way above the noise floor of the measurement equipment). However, for signals that are weak, special care must be taken in the correct selection of the measurement bandwidth. As a rule of thumb, the sensitivity of an RF power measurement goes up 3 dB if the measurement bandwidth is cut in half. This might make it tempting to always select the smallest possible measurement bandwidth. It is important to know, however, that the smaller the measurement bandwidth, the longer the time required to execute the measurement.
388. , and R. Grewal, “Microwave Electronic Calibration: Transferring Standards Lab Accuracy to the Production Floor,” Microwave Journal, Vol. 37, No. 9, 1994, pp. 94–105. , “Techniques Optimize Calibration of PCB Fixtures and Probes,” Microwaves & RF, Vol. 34, No. 11, 1995, pp. 93–98. , “Error Models for Systems Measurement,” Microwave Journal, Vol. 22, No. 5, 1978, pp. 63–66. Concepts of Production Testing of RF, SoC, and SiP Devices 19  Agilent Technologies, “Ultra Wideband Communication RF Measurements,” Application Note 1488, 2004.
Numerous papers have been written on various types of distortion tests ranging from audio frequencies to several gigahertz, but when one considers the 35 36 Advanced Production Testing of RF, SoC, and SiP Devices basic phenomenon of distortion, it all leads to the same result: degradation of desired signal. 2 Linearity Distortion occurs due to the nonlinear behavior of a device. All devices, whether RF or otherwise, exhibit nonlinear behavior. At times it is part of proper operation, as in the case of a high-efficiency power amplifier, mixer, or frequency doubler.
Advanced Production Testing of RF, SoC, and SiP Devices by Joe Kelly